JEOL JEM 2200FS, double Cs-corrected scanning transmission electron microscope

• high tension: 60 .. 200 kV
• Cs-correctors (CEOS) for the probe forming as well as imaging system
• in-column energy filter
• energy dispersive X-ray detector (Bruker)
• two high angle annular dark field detectors
• bright field detector
• 2k x 2k camera (Ultrascan Gatan)
• fast 2k x 2k camera (Orius Gatan)
• analytical double tilt sample holder
• liquid nitrogen sample holder

used for:

• Cs-corrected high-resolution imaging
• scanning transmission electron microscopy with Cs-corrected probe
• Z-contrast imaging (HAADF)
• energy-dispersive X-ray spectroscopy (EDXS)
• electron energy loss spectroscopy (EELS)

image simulation:

• JEMS
• HREM for reconstruction of exit wave function amplitude and phase
• HREM for Z-contrast imaging simulation (absorptive potential method)
• geometric phase analysis
• peak pair analysis
• STEMsim

Further electron micorscopes and sample preparation facilities at Philipps-Universität can be found here.