BEGIN:VCALENDAR
VERSION:2.0
PRODID:-//Plone.org//NONSGML plone.app.event//EN
X-WR-TIMEZONE:Europe/Berlin
BEGIN:VEVENT
SUMMARY:Quantitative Evaluation of the Interfaces in III/V Semiconductors 
 with Scanning Transmission Electron Microscopy
DTSTART;TZID=Europe/Berlin:20171129T141500
DTEND;TZID=Europe/Berlin:20171129T154500
DTSTAMP:20260407T005503Z
UID:893e97741d0c4a7f83258ed373e51b40@www.uni-marburg.de
ATTENDEE;CN="Referentin: Prof. Dr. Kerstin Volz; Koreferent: Prof. Dr. Mar
 tin Koch";ROLE=REQ-PARTICIPANT:Referentin: Prof. Dr. Kerstin Volz; Korefer
 ent: Prof. Dr. Martin Koch
CREATED:20171023T094159Z
DESCRIPTION:https://www.uni-marburg.de/de/fb13/aktuelles/termine/examensar
 beiten/2017/quantitative-evaluation-of-the-interfaces-in-iii-v-semiconduct
 ors-with-scanning-transmission-electron-microscopy\nDisputation von Han Ha
 n
LAST-MODIFIED:20171023T094200Z
LOCATION:Fachbereich Physik\, Hans-Meerwein-Str. 6\, Mehrzweckgebäude\, R
 . 02D36
URL:https://www.uni-marburg.de/de/fb13/aktuelles/termine/examensarbeiten/2
 017/quantitative-evaluation-of-the-interfaces-in-iii-v-semiconductors-with
 -scanning-transmission-electron-microscopy
END:VEVENT
BEGIN:VTIMEZONE
TZID:Europe/Berlin
X-LIC-LOCATION:Europe/Berlin
BEGIN:STANDARD
DTSTART:20171029T020000
TZNAME:CET
TZOFFSETFROM:+0200
TZOFFSETTO:+0100
END:STANDARD
END:VTIMEZONE
END:VCALENDAR