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SUMMARY:Analysis of Strain Relaxation\, Ion Beam Damage and Instrument Imp
 erfections for Quantitative STEM Characterization
DTSTART;TZID=Europe/Berlin:20191014T103000
DTEND;TZID=Europe/Berlin:20191014T120000
DTSTAMP:20260407T124038Z
UID:89f33e8d849c4adeaf3aa71f60b4d8ab@www.uni-marburg.de
ATTENDEE;CN="Referentin: Prof. Dr. Kerstin Volz, Koreferent: Prof. Dr. San
 gam Chatterjee";ROLE=REQ-PARTICIPANT:Referentin: Prof. Dr. Kerstin Volz, K
 oreferent: Prof. Dr. Sangam Chatterjee
CREATED:20191011T085814Z
DESCRIPTION:https://www.uni-marburg.de/de/fb13/aktuelles/termine/examensar
 beiten/2019/analysis-of-strain-relaxation-ion-beam-damage-and-instrument-i
 mperfections-for-quantitative-stem-characterization\nDisputation von Jürg
 en Belz
LAST-MODIFIED:20191011T085854Z
LOCATION:Fachbereich Physik\, Hans-Meerwein-Str. 6\, Mehrzweckgebäude\, R
 . 02D36
URL:https://www.uni-marburg.de/de/fb13/aktuelles/termine/examensarbeiten/2
 019/analysis-of-strain-relaxation-ion-beam-damage-and-instrument-imperfect
 ions-for-quantitative-stem-characterization
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TZID:Europe/Berlin
X-LIC-LOCATION:Europe/Berlin
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DTSTART:20190331T030000
TZNAME:CEST
TZOFFSETFROM:+0100
TZOFFSETTO:+0200
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