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Project A4: Reactivity, Energetics and Structure of Buried Organic/Metal Interfaces

Principle Investigator: Prof. Dr. Michael Gottfried, Dr. Martin Schmid (Marburg, Dept. of Chemistry)


a4_logo.pngChemical reactions and diffusion processes at buried metal/organic interfaces lead to the formation of reaction zones (interphases), which can greatly influence the properties of contacts between metals and organic semiconductors. The chemical, electronic, energetic and kinetic aspects of the interphase formation are investigated using Hard X-ray Photoelectron Spectroscopy (HAXPES) for chemical depth profiling, Nanojoule Calorimetry (NC), and complementary methods.
Ongoing HAXPES and NC studies of metal deposition onto molecular solids at variable temperatures will be continued and extended to thermally sensitive molecules. Their deposition is possible with the newly established Electrospray Ionization Ion Beam Deposition (ESI-IBD) and complementary Neutral Spray Deposition (NSD). The influences of defects on the interface reactivity will be systematically explored using model metal/organic interfaces based on well-defined vicinal (stepped) metal surfaces.
As a new class of model systems, covalent heterointerfaces with thiol-anchored organic molecules on transition metal dichalcogenides are introduced. The potential of the HAXPES depth profiling technique will be further exploited to study diffusion processes at model organic/organic interfaces and to retrieve spatial band bending information for semiconductor interfaces.

Project-Related Publications

  1. M. Chen, M. Röckert, J. Xiao, H.-J. Drescher, H.-P. Steinrück, O. Lytken, J. M. Gottfried, Coordination reactions and layer exchange processes at a buried metal-organic interface, J. Phys. Chem. C 118, 8501 (2014).
  2. M. Chen, H. Zhou, B. P. Klein, M. Zugermeier, C. K. Krug, H.-J. Drescher, M. Gorgoi, M. Schmid, J. M. Gottfried Formation of an Interphase Layer During Deposition of Cobalt onto Tetraphenylporphyrin: A Hard X-Ray Photoelectron Spectroscopy (HAXPES) Study Phys. Chem. Chem. Phys. 18, 30643 (2016).
  3. J.M. Gottfried Quantitative Model Studies for Interfaces in Organic Electronic Devices New J. Phys. 18, 113022 (2016).

Zuletzt aktualisiert: 16.03.2018 · armbrusn

Philipps-Universität Marburg

Sonderforschungsbereich 1083, Philipps-Universität Marburg, Renthof 5, 35032 Marburg, Germany
Tel. +49 6421 28-24223, Fax +49 6421 28-24218, E-Mail: info@uni-marburg.de

URL dieser Seite: https://www.uni-marburg.de/sfb1083/projects/A4

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