Main Content

Publications

2023

Self-catalyzed GaP nanowire MOVPE growth on Si
D. Krug, J. Glowatzki, F. Hüppe, M. Widemann, F. Gruber, A. Beyer, K. Volz
J. Cryst. Growth 609 (2023), 127138

Gain recovery dynamics in active type-II semiconductor heterostructures
F. Schäfer, M. Stein, J. Lorenz, F. Dobener, C. Ngo, J. T. Steiner, C. Fuchs, W. Stolz, K. Volz, T. Meier, J. Hader, J. V. Moloney, S. W. Koch, and S. Chatterjee
Appl. Phys. Lett. 122 (8) (2023), 082104

Formation of an Artificial Cathode–Electrolyte Interphase to Suppress Interfacial Degradation of Ni-Rich Cathode Active Material with Sulfide Electrolytes for Solid-State Batteries
T.-T. Zuo, F. Walther, S. Ahmed, R. Rueß, J. Hertle, B. Mogwitz, K. Volz, and J. Janek
ACS Energy Lett. 8 (2023), pp. 1322 – 1329

2022

Coating versus Doping: Understanding the Enhanced Performance of High-Voltage Batteries by the Coating of Spinel LiNi0.5Mn1.5O4 with Li0.35La0.55TiO3
V. Mereacre, P. Stüble, V. Trouillet, S. Ahmed, K. Volz, J. R. Binder
Adv. Mater. Interfaces (2022), 2201324

Probing the Ni(OH)2 Precursor for LiNiO2 at the Atomic Scale: Insights into the Origin of Structural Defect in a Layered Cathode Active Material

A. Pokle, D. Weber, M. Bianchini, J. Janek, K. Volz
Small (2022), 2205508

Insights into molecular cluster materials with adamantane-like core structures by considering dimer interactions
S. Schwan, A. J. Achazi, F. Ziese, P. R. Schreiner, K. Volz, S. Dehnen, S. Sanna, D. Mollenhauer
J. Comput. Chem. (2022), pp. 1 - 14

Phase relaxation control in heterostructures featuring charge-transfer excitons
M. Fey, M. Stein, C. Fuchs, W. Stolz, K. Volz, and S. Chatterjee
Phys. Rev. B 106 (2022), 165303

AlN Buffer Enhances the Layer Quality of MBE-Grown Cubic GaN on 3C-SiC
M. F. Zscherp, N. Mengel, D. M. Hofmann, V. Lider, B. Ojaghi Dogahe, C. Becker, A. Beyer, K. Volz, J. Schörmann, and S. Chatterjee
Cryst. Growth Des. 22 (11) (2022), pp. 6786 – 6791

Octave-spanning emission across the visible spectrum from single crystalline 1,3,5,7-tetrakis-(p-methoxyphenyl)adamantane
M. J. Müller, F. Ziese, J. Belz, F. Hüppe, S. Gowrisankar, B. Bernhardt, S. Schwan, D. Mollenhauer, P. R. Schreiner, K. Volz, S. Sanna, and S. Chatterjee
Opt. Mater. Express 12 (9) (2022), pp. 3517 - 3529

Terahertz radiation from propagating acoustic phonons based on deformation potential coupling
S.-H. Park, S. Lee, K. Ishioka, C. J. Stanton, C.-S. Kee, A. Beyer, U. Höfer, W. Stolz, K. Volz, and Y.-D. Jho
Opt. Express 30 (13) (2022), pp. 23544 - 23555

Deeper Understanding of the Lithiation Reaction during the Synthesis of LiNiO2 Towards an Increased Production Throughput
P. Kurzhals, F. Riewald, M. Bianchini, S. Ahmed, A. M. Kern, F. Walther, H. Sommer, K. Volz and J. Janek
J. Electrochem. Soc. 169 (5) (2022), 050526

Quantitative composition determination by ADF-STEM at a low angular regime: a combination of EFSTEM and 4DSTEM
S. Firoozabadi, P. Kükelhan, A. Beyer, J. Lehr, D. Heimes, K. Volz
Ultramicroscopy 240 (2022), 113550

Adamantanes as White-Light Emitters: Controlling the Arrangement and Functionality by External Coulomb Forces
J. Belz, J. Haust, M. J. Müller, K. Eberheim, S. Schwan, S. Gowrisankar, F. Hüppe, A. Beyer, P. R. Schreiner, D. Mollenhauer, S. Sanna, S. Chatterjee, and K. Volz
J. Phys. Chem. C 126, (23) (2022), pp. 9843 – 9854

Advanced Analytical Characterization of Interface Degradation in Ni-Rich NCM Cathode Co-Sintered with LATP Solid Electrolyte

M. Malaki, A. Pokle, S.-K. Otto, A. Henss, J. P. Beaupain, A. Beyer, J. Müller, B. Butz, K. Wätzig, M. Kusnezoff, J. Janek, K. Volz
ACS Appl. Energy Mater. 5 (4) (2022), pp. 4651 – 4663

Tracing Low Amounts of Mg in the Doped Cathode Active Material LiNiO2
D. Weber, J. Lin, A. Pokle, K. Volz, J. Janek, T. Brezesinski, M. Bianchini
Journal of The Electrochemical Society 169 (3) (2022), 030540

Effect of growth interruption on Ga(N, As)/Ga(As, Sb)/Ga(N, As) type-II-“W” quantum well heterostructures

J. Lehr, L. Hellweg, C. Fuchs, S. Firoozabadi, P. Kükelhan, A. Beyer, K. Volz, W. Stolz
J. Cryst. Growth 582 (2022), 126501

Selective Effects of the Host Matrix in Hydrogenated InGaAsN Alloys: Toward an Integrated Matrix/Defect Engineering Paradigm
F. Filippone, S. Younis, G. Mattioli, M. Felici, E. Blundo, A. Polimeni, G. Pettinari, D. Giubertoni, E. Sterzer, K. Volz, D. Fekete, E. Kapon, A. Amore Bonapasta
Adv. Funct. Mater. 32 (5) (2022) 2108862

Room-temperature laser operation of a Ga(In,As)/Ga(As,Bi)/Ga(In,As) W-type laser diode
T. Hepp, J. Lehr, R. Günkel, O. Maßmeyer, J. Glowatzki, A. Ruiz Perez, S. Reinhard, W. Stolz, K. Volz
Electron. Lett. 58 (2) (2022), pp. 70 – 72

A Dry-Processed Al2O3/LiAlO2 Coating for Stabilizing the Cathode/Electrolyte Interface in High-Ni NCM-Based All-Solid-State Batteries
R. S. Negi, Y. Yusim, R. Pan, S. Ahmed, K. Volz, R. Takata, F. Schmidt, A. Henss, and M. T. Elm
Adv. Mater. Interfaces 9 (8) (2022), 2101428

2021

Performance characteristics of low threshold current 1.25 μm type-II GaInAs/GaAsSb 'W'-lasers for optical communications
D. A. Duffy, I. P. Marko, C. Fuchs, T. D. Eales, J. Lehr, W. Stolz and S. J. Sweeney
J. Phys. D: Appl. Phys. 54 (36) (2021), 365104

Revealing the Significance of Catalytic and Alkyl Exchange Reactions during GaAs and GaP Growth by Metal Organic Vapor Phase Epitaxy
O. Maßmeyer, J. Haust, T. Hepp, R. Günkel, J. Glowatzki, C. von Hänisch, W. Stolz, K. Volz
ACS Omega 6 (42) (2021), pp. 28229 – 28241

Stabilizing the Cathode/Electrolyte Interface Using a Dry-Processed Lithium Titanate Coating for All-Solid-State Batteries
R. S. Negi, P. Minnmann, R. Pan, S. Ahmed, M. J. Herzog, K. Volz, R. Takata, F. Schmidt, J. Janek, and M. T. Elm
Chem. Mater. 33 (17) (2021), pp. 6713 – 6723

Understanding the formation of antiphase boundaries in layered oxide cathode materials and their evolution upon electrochemical cycling
S. Ahmed, A. Pokle, M. Bianchini, S. Schweidler, A. Beyer, T. Brezesinski, J. Janek, K. Volz
Matter 4 (12) (2021), pp. 3953 – 3966

Dilute Bismuth Containing W-Type Heterostructures for Long-Wavelength Emission on GaAs Substrates
T. Hepp, J. Veletas, R. Günkel, O. Maßmeyer, J. Glowatzki, W. Stolz, S. Chatterjee, and K. Volz
Cryst. Growth Des. 21 (11) (2021), pp. 6307 – 6313

Optimization of imaging conditions for composition determination by annular dark field STEM
S. Firoozabadi, P. Kükelhan, T. Hepp, A. Beyer, K. Volz
Ultramicroscopy 230 (2021), 113387

Quantification of low-Z elements by energy-filtered scanning transmission electron microscopy
S. Firoozabadi, A. Beyer, P. Kükelhan, D. Heimes, J. Lehr, K. Volz
Microscopy and Microanalysis 27 (S1) (2021), pp. 1528 – 1529

A robust technique to image all elements in LiNiO2 cathode active material by 4D-STEM
S. Ahmed, A. Pokle, J. Belz, M. Bianchini, A. Beyer, J. Janek and K. Volz
Microscopy and Microanalysis 27 (S1) (2021), pp. 1446 – 1449

Analyzing Nanometer-Thin Cathode Particle Coatings for Lithium-Ion Batteries — The Example of TiO2 on NCM622
Y. Moryson, F. Walther, J. Sann, B. Mogwitz, S. Ahmed, S. Burkhardt, L. Chen, P. J. Klar, K. Volz, S. Fearn, M. Rohnke, and J. Janek
ACS Appl. Energy Mater. 4 (7) (2021), pp. 7168 – 7181

Synthesis and Postprocessing of Single-Crystalline LiNi0.8Co0.15Al0.05O2 for Solid-State Lithium-Ion Batteries with High Capacity and Long Cycling Stability
R. Fantin, E. Trevisanello, R. Ruess, A. Pokle, G. Conforto, F. H. Richter, K. Volz, and J. Janek
Chem. Mater. 33 (7) (2021), pp. 2624 - 2634

Angle-resolved STEM using an iris aperture: Scattering contributions and sources of error for the quantitative analysis in Si
T. Grieb, F. F. Krause, K. Müller-Caspary, S. Firoozabadi, C. Mahr, M. Schowalter, A. Beyer, O. Oppermann, K. Volz, A. Rosenauer
Ultramicroscopy 221 (2021), 113175

Optimized atomic layer deposition of homogeneous, conductive Al2O3 coatings for high-nickel NCM containing ready-to-use electrodes
R. S. Negi, S. P. Culver, M. Wiche, S. Ahmed, K. Volz and M. T. Elm
Phys. Chem. Chem. Phys. 23 (11) (2021), pp. 6725 – 6737

Quantitative Characterization of Nanometer-Scale Electric Fields via Momentum-Resolved STEM
A. Beyer, M. S. Munde, S. Firoozabadi, D. Heimes, T. Grieb, A. Rosenauer, K. Müller-Caspary, and K. Volz
Nano Letters 21 (5) (2021), 2018–2025

Comparison of carrier-recombination in Ga(As,Bi)/Ga(N,As)-type-II quantum wells and W-type heterostructures
J. Veletas, T. Hepp, F. Dobener, K. Volz, and S. Chatterjee
Appl. Phys. Lett. 118 (5) (2021), 052103

Monitoring the thermally induced transition from sp3-hybridized into sp2-hybridized carbons

D. B. Schüpfer, F. Badaczewski, J. Peilstöcker, J. M. Guerra-Castro, H. Shim, S. Firoozabadi, A. Beyer, K. Volz, V. Presser, C. Heiliger, B. Smarsly, P. J. Klar
Carbon 172 (2021), pp. 214 – 227

The influence of growth interruption on the luminescence properties of Ga(As,Sb)-based type II heterostructures
L. Rost, J. Lehr, M. Maradiya, L. Hellweg, F. Fillsack, W. Stolz, W. Heimbrodt
Journal of Luminescence 231 (2021), 117817

2020

In Situ Monitoring of Thermally Induced Effects in Nickel-Rich Layered Oxide Cathode Materials at the Atomic Level
A. Pokle, S. Ahmed, S. Schweidler, M. Bianchini, T. Brezesinski, A. Beyer, J. Janek, and K. Volz
ACS Appl. Mater. Interfaces 12 (51) (2020), pp. 57047 – 57054

Influence of plasmon excitations on atomic-resolution quantitative 4D scanning transmission electron microscopy
A. Beyer, F. F. Krause, H. L. Robert, S. Firoozabadi, T. Grieb, P. Kükelhan, D. Heimes, M. Schowalter, K. Müller-Caspary, A. Rosenauer & K. Volz
Scientific Reports 10 (2020), 17890

Femtosecond time-resolved nonlinear optical spectroscopy of charge transfer at the buried GaP/Si(001) interface
G. Mette, J. E. Zimmermann, A. Lerch, K. Brixius, J. Güdde, A. Beyer, M. Dürr, K. Volz, W. Stolz, and U. Höfer
Appl. Phys. Lett. 117 (8) (2020), 081602

In situ analysis of Bi terminated GaAs (0 0 1) and Ga(As,Bi) surfaces during growth by MOVPE
O. Maßmeyer, T. Hepp, R. Günkel, J. Glowatzki, W. Stolz, K. Volz
Applied Surface Science 533 (2020), 147401

Widely Tunable Terahertz‐Generating Semiconductor Disk Laser

K. A. Fedorova, H. Guoyu, M. Wichmann, C. Kriso, F. Zhang, W. Stolz, M. Scheller, M. Koch, A. Rahimi-Iman
Phys. Status Solidi RRL 14 (10) (2020), 2000204

Self-Assembly of Nanovoids in Si Microcrystals Epitaxially Grown on Deeply Patterned Substrates

A. Barzaghi, S. Firoozabadi, M. Salvalaglio, R. Bergamaschini, A. Ballabio, A. Beyer, M. Albani, J. Valente, A. Voigt, D. J. Paul, L. Miglio, F. Montalenti, K. Volz, and G. Isella
Cryst. Growth Des. 20 (5) (2020), pp. 2914 – 2920

Ga(N,P) Growth on Si and Decomposition Studies of the N–P Precursor Di-tert-butylaminophosphane (DTBAP)

J. Glowatzki, O. Maßmeyer, M. Köster, T. Hepp, E. Odofin, C. von Hänisch, W. Stolz and K. Volz
Organometallics 39 (10) (2020), pp. 1772 – 1781

Progress in Sputter Growth of β‐Ga2O3 by Applying Pulsed‐Mode Operation

P. Schurig, F. Michel, A. Beyer, K. Volz, M. Becker, A. Polity, P. J. Klar
Phys. Status Solidi A 217 (10) (2020), 1901009

Direct Probe of Room-Temperature Quantum-Tunneling Processes in Type-II Heterostructures Using Terahertz Emission Spectroscopy
M. Stein, C. Fuchs, W. Stolz, D. M. Mittleman, and M. Koch
Phys. Rev. Applied 13 (5) (2020), 054073

Visualization of Light Elements using 4D STEM: The Layered‐to‐Rock Salt Phase Transition in LiNiO2 Cathode Material
S. Ahmed, M. Bianchini, A. Pokle, M. S. Munde, P. Hartmann, T Brezesinski, A. Beyer, J. Janek, K. Volz
Adv. Energy Mater. 10 (25) (2020), 2001026

Epitaxial Growth and Structural Characterization of Ceria Deposited by Atomic Layer Deposition on High-Surface Porous Yttria-Stabilized Zirconia Thin Films

M. F. Zscherp, J. Glaser, C. Becker, A. Beyer, P. Cop, J. Schörmann, K. Volz, M. T. Elm
Cryst. Growth Des. 20 (4) (2020), pp. 2194 – 2201

Anomalous Angle-Dependent Magnetotransport Properties of Single InAs Nanowires
P. Uredat, R. Kodaira, R. Horiguchi, S. Hara, A. Beyer, K. Volz, P. J. Klar, M. T. Elm
Nano Lett. 20 (1) (2020), pp. 618 - 624

Wavelength and Pump-Power Dependent Nonlinear Refraction and Absorption in a Semiconductor Disk Laser
C. Kriso, S. Kress, T. Munshi, M. Grossmann, R. Bek, M. Jetter, P. Michler, W. Stolz, M. Koch, A. Rahimi-Iman
IEEE Photonics Technology Letters 32 (2) (2020), pp. 85 - 88