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Devices

Characterization

• Inhalt ausklappen Inhalt einklappen EQE

  

  The EQE Setup (also IPCE) is able to perform multiple measurements such as Dark JV, IPCE, EL-PL-Spectrum, Pulsed EL, 4-Point Probe (all steady state) or Transient Photo Response, Electrical Impendance Spectroscopy and Charge Extraction by Linearly Increasing Voltage (all transient).

• Inhalt ausklappen Inhalt einklappen Sun Simulator IV

  

  The exceeding Class A Sun Simulator offers a high precision spectral mismatch of < 5%. Typical measurements performed are JV scans and maximum powerpoint tracking. 

• Inhalt ausklappen Inhalt einklappen Hall Setup

  

  The Hall Setup does measurements of resistance of thin film using the Van der Pauw method. It allows the caracterization of semiconductor devices regarding their electric transport properties, like the Hall mobility, Charge Carrier Concentration, Resistivity and the Seebeck Coefficient. 

• Inhalt ausklappen Inhalt einklappen Hyperspectral Imaging

  

  This Hyperspectral Imager can be used to collect a full spectrum of every pixel and to map Bandgap variations, Material composition differences, Phase segregation, Crystallinity variations and defects. Also PL and EL mappings can be done for example to determine the QFLS.

• Inhalt ausklappen Inhalt einklappen Photoluminescence quantum yield (PLQY)

  

  This system can be used to quantify absolute electro- and photoluminescence fluxes of thin film absorbers, layer stacks or complete devices under various operating conditions.

• Inhalt ausklappen Inhalt einklappen Ellipsometer

  

  An ellipsometer is used to precisely measure thin-film optical and physical properties. It works by shining polarized light onto a surface and analyzing how the polarization changes after reflection. Therefore it can be used to map the uniformity across the sample, characterize surface roughness or to identify material compositions and bandgap shifts.

• Inhalt ausklappen Inhalt einklappen Time Resolved Photoluminescence

  

  This technology can be used to understand the behaviour of charges over time after photoexcitation. The TRPL measures how fast a material emits light, which gives direct insight into recombination dynamics. 

• Inhalt ausklappen Inhalt einklappen Ageing Setups

  

  

  Our light soaking chambers consist of multiple arrays of LED’s to achieve a high level of homogeneity. In addition we are using a self-built temperature station to have full control over the temperatur during the measurements and different sensors to check the humidity, O2 levels and the luminous intensity. 

• Inhalt ausklappen Inhalt einklappen UV-Vis

  

  The UV-Vis can measure the reflection and transmission of a material and provides us with information about the absorption behaviour. It also allows us to extract the bandgap from the semiconductors.