STEM/TEM for quantitative analysis of hybrid materials
Simulations of structural evolution and microscopy images
Analysis of Si and Ge substrates functionalized with III/V semiconductors
Quantitative characterization of III/V hetero interfaces
Quantitative analysis of novel materials for battery applications
TEM/STEM during epitaxial growth
This video summarizes the work of the Marburg group in the https://festbatt.net/ Project.
