Devices and Applications

Based on the detailed understanding of the epitaxial deposition process and the quantitative structural analysis of the realized sophisticated III/V-semiconductor layer stack by means of high-resolution X-ray diffraction and in particular various sophisticated transmission electron microscopy analysis techniques, novel optoelectronic device concepts also applying novel material systems with designed optoelectronic properties are realized. Part of these application specific research projects are performed in close cooperation with institutional and industry partners.