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Hetero Interfaces

Quantitative information at atomic resolution at interfaces, where two different materials meet, is often desirable, as charge and energy transfer across interfaces is correlated to their exact structure. However, experimentally the achievable resolution in electron microscopic techniques depends on many parameters, like the Z-contrast of the two materials forming the interface, their lattice mismatch as well as on TEM sample parameters, like thickness and amorphous top layers. We develop a quantitative understanding, to which extend atomic resolution at interfaces can be truly quantitative.

This is also used to determine the interface structure of different materials and to derive intrinsic interface structures, which only depend on material combination and not on growth conditions, for example.