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Scanning Transmission Electron Microscope JEOL JEM-2200FS

Photo: Thomas Demuth

Specifications

  • Acceleration Voltage: 80 kV & 200 kV
  • Cs corrected TEM mode (until 3rd order), resolution < 1.5 Å
  • Cs corrected STEM mode (until 3rd order), resolution < 1 Å
  • Scanning Precession Electron Diffraction mode (NanoMEGAS)
  • Nanobeam Diffraction mode
  • Omega-Energy filter: EELS (resolution 0,7 eV), EFTEM

Detectors and Cameras

  • BF, ADF detektors
  • EDX detector Ultim Max TEM (windowless, 80 mm^2, resolution ≤ 127 eV @ MnKα)
  • pnCCD 4D (S)TEM Camera (direct electron detector: full frame: 264x264 pixels, 1000 fps)
  • TVIPS TemCam  XF416 (full frame: 4k x 4k pixels, 48 fps)

TEM Holders

  • Single-tilt-analytics holder
  • Double-tilt-analytics holder
  • Tomography holder
  • Double-tilt + Inert gas transfer + cryo holder (Mel-Build) 
  • In-Situ heating and biasing holder (Protochips Fusion)
  • In-Situ heating in gas atmosphere holder (Protochips Atmosphere)